公开(公告)号：US20100001212A1

公开(公告)日：2010-01-07

申请号：US12490696

申请日：2009-06-24

申请人： Hideaki NISHIUCHI ,  Kazuyoshi SAITO ,  Masahiro TADOKORO ,  Hiroshi AKIYAMA ,  Kazuo HIRAMOTO

发明人： Hideaki NISHIUCHI ,  Kazuyoshi SAITO ,  Masahiro TADOKORO ,  Hiroshi AKIYAMA ,  Kazuo HIRAMOTO

IPC分类号： G21G5/00

CPC分类号： A61N5/10 ,  A61N2005/1087 ,  H05H7/10 ,  H05H13/04

摘要： A charged particle beam irradiation system includes measurement means 15 for measuring an accumulated beam charge amount Qm0, the ion beams orbiting in a synchrotron 13, immediately before an extraction control period in an operating cycle of the synchrotron 13; and beam extraction control means 20, 24, 28, 29 for controlling extraction of the ion beams so that extraction of a total of the ion beams is to be completed in time with expiration of an extraction control time Tex which is set in advance based on the measurement Qm0 of the accumulated beam charge amount. When an irradiation apparatus includes an RMW 32, an amplitude of an extraction radiofrequency voltage is controlled according to a ratio Qm0/Qs0 of the measurement to a reference value of the accumulated beam charge amount and a ratio Tb/Ta of an actual beam extraction time to the extraction control time Tex.

摘要翻译： 带电粒子束照射系统包括测量装置15，用于在同步加速器13的操作循环中紧接在提取控制周期之前测量积累的光束电荷量Qm0，即在同步加速器13中绕行的离子束; 以及用于控制离子束的提取的光束提取控制装置20,24,28,29，使得总共离子束的提取将在提前控制时间Tex的期满的时间内完成，该提取控制时间Tex基于 累积光束电荷量的测量Qm0。 当照射装置包括RMW 32时，根据测量的比率Qm0 / Qs0来控制提取射频电压的幅度与累积光束电荷量的参考值和实际光束提取时间的比率Tb / Ta 到提取控制时间Tex。