公开(公告)号：US06204681B1

公开(公告)日：2001-03-20

申请号：US09225242

申请日：1999-01-04

申请人： Hideaki Nagatsuka ,  Hideyuki Takeuchi ,  Makoto Fukushima

发明人： Hideaki Nagatsuka ,  Hideyuki Takeuchi ,  Makoto Fukushima

IPC分类号： G01R3102

CPC分类号： G01R31/2886

摘要： An IC device contactor for electrically connecting IC devices each having a large number of spherical electrodes on one side of a substrate to an IC tester head for a test of electrical properties or characteristics. The IC device contactor includes: a socket board having a predetermined number of contact points formed on a surface thereof; an anisotropic conductive sheet having a multitude of fine conductive wires embedded in the insulating sheet in an angularly oriented state; a tip holder perforated with a predetermined number of apertures; and a predetermined number of contact tips fitted in the apertures of the tip holder for contact with the spherical electrodes of the IC devices. The anisotropic conductive sheet is disposed with its side in engagement with the socket board and the other side in engagement with the contact tips to electrically connect the contact tips with the contact points on the socket board. The contact tips are assembled with the tip holder in such a way as to be securely retained in position within the respective aperture and are brought into pressed contact with the anisotropic conductive sheet at one end while the other end of the contact tips is projected out of the aperture by a predetermined length.

摘要翻译： 一种IC器件接触器，用于将每个具有大量球形电极的IC器件电连接到IC测试器头，用于测试电气特性或特性。 IC器件接触器包括：在其表面上形成有预定数量的接触点的插座板; 各向异性导电片，其具有以成角度取向的状态嵌入绝缘片中的多根细导线; 穿过预定数量的孔的尖端保持架; 以及装配在尖端保持器的孔中的预定数量的接触尖端，用于与IC器件的球形电极接触。 各向异性导电片的侧面与插座板配合，另一侧与接触尖端配合，以使接触尖端与插座板上的接触点电连接。 接触尖端与尖端保持器组装成能够牢固地保持在相应孔内的适当位置，并且在一端与各向异性导电片压接接触，而接触尖端的另一端突出于 孔径预定长度。