Abnormality Detection System and Abnormality Detection Method

    公开(公告)号:US20220397894A1

    公开(公告)日:2022-12-15

    申请号:US17828714

    申请日:2022-05-31

    Applicant: Hitachi, Ltd.

    Abstract: Provided are an abnormality detection system and an abnormality detection method capable of performing more stable abnormality detection. An abnormality detection system that detects an abnormality of the target machine by a computer includes a communication unit configured to acquire first data from a first sensor attached to the target machine and second data from a second sensor attached to the target machine, an arithmetic unit, and a memory unit. The arithmetic unit includes an encoding unit trained to generate latent expressions including a predetermined latent expression that estimates the second data on the basis of the first data, a decoding unit trained to restore the first data from the latent expressions, and an abnormality detection unit configured to detect the abnormality of the target machine on the basis of a restoration error between the first data and the first data restored by the decoding unit.

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