公开(公告)号：US20240104409A1

公开(公告)日：2024-03-28

申请号：US18206374

申请日：2023-06-06

Applicant: Hitachi, Ltd.

Inventor： Yuuki SHIMIZU

IPC: G06N5/045

CPC classification number: G06N5/045

Abstract: A fault tree in which causes for failure events are appropriately developed is generated. A fault tree generation device according to the present invention includes a formula database that stores formulas related to physical phenomena, a formula base causal model generation unit that generates a causal relationship of failure events based on the formulas, a formula base fault tree generation unit that generates a formula base fault tree that is a combination of the causal relationships of the failure events, and an output unit that outputs the formula base fault tree.

公开(公告)号：US20210216673A1

公开(公告)日：2021-07-15

申请号：US17121793

申请日：2020-12-15

Applicant: Hitachi, Ltd.

Inventor： Yuki ITABAYASHI ,  Makoto ONODERA ,  Yuuki SHIMIZU ,  Akira KAMEI ,  Masayuki HARIYA

IPC: G06F30/10

Abstract: A design support device includes a unit that accepts registration of normal CAD data with a past record and violation CAD data determined to have violated portion with respect to three-dimensional CAD data, a unit that acquires a parameter related to a design rule from CAD data to be evaluated, a unit that calculates a statistical value of the acquired parameter and calculates a value of an influence degree t that explains a violation of each parameter, and a unit that presents a scatter diagram plotting normal CAD data and violation CAD data to be evaluated and a boundary line subjected to cluster analysis, on a two-dimensional coordinate system, according to a combination of parameters designated by a user (evaluator).

公开(公告)号：US20210041863A1

公开(公告)日：2021-02-11

申请号：US17041358

申请日：2019-01-30

Applicant: Hitachi, Ltd.

Inventor： Yohei TANNO ,  Yuuki SHIMIZU

IPC: G05B23/02

Abstract: Personal dependency related to fault tree construction is reduced, and the reliability of an operating machine is improved by improving the accuracy of a fault diagnosis. The present invention provides a fault diagnosis device for a machine in operation, the device comprising: an abnormality degree analysis unit that calculates the abnormality degree of each component configuring the machine by comparing input/output data of the machine with a threshold value; a fault tree automatic generation unit that holds a fault tree of each component in which the fault of each component and the fault of a sensor in each component are associated with each other and generates the fault tree of the entire machine by coupling the fault trees of the components on the basis of a correlation between the input/output data of each component; a fault analysis unit that analyzes the fault of the machine on the basis of the abnormality degree and information of the fault tree of the entire machine; and a display unit that displays information analyzed by the fault analysis unit and issues an alarm.

公开(公告)号：US20240126946A1

公开(公告)日：2024-04-18

申请号：US18461849

申请日：2023-09-06

Applicant: Hitachi, Ltd.

Inventor： Yuki ITABAYASHI ,  Yuuki SHIMIZU

IPC: G06F30/20

CPC classification number: G06F30/20 ,  G06F2119/18

Abstract: To provide a design supporting device and a design supporting method capable of presenting a specific improvement plan for solving evaluation indexes having a trade-off relationship. The design supporting device comprises: an input unit which inputs a plurality of evaluation indexes and attribute information; a retrieval unit which acquires information on cases for improvement cases using the input information; a priority order calculation unit which prioritizes the cases; and an output unit which prioritizes cases for improvement plans of evaluation indexes being in a trade-off relationship and presents the same to the outside.

公开(公告)号：US20230297094A1

公开(公告)日：2023-09-21

申请号：US18021345

申请日：2021-04-14

Applicant: Hitachi, Ltd.

Inventor： Yuuki SHIMIZU

IPC: G05B23/02

CPC classification number: G05B23/0229 ,  G05B23/0251 ,  G05B23/024

Abstract: When a fault occurs in the prior art, it is necessary to exhaustively cover combinations of the field, product, and usage environment in which a component is used and create a model for determining priority degree. The person-hours required to create such a model represent a problem. In order to solve this problem, a fault tree generation unit 111 automatically generates a fault tree on the basis of the causal relationship of defects to events to be analyzed, and a score calculation unit 113 additionally calculates a priority degree (score) for the individual events in the generated fault tree by means of the number of co-occurrences of “events” and “event-related information” in past defect information on the basis of “event-related information” in which a component is used, then presents a scored fault tree to which the scores have been applied.

公开(公告)号：US20250111103A1

公开(公告)日：2025-04-03

申请号：US18887569

申请日：2024-09-17

Applicant: Hitachi, Ltd.

Inventor： Yuuki SHIMIZU ,  Erika Watanabe

IPC: G06F30/20

Abstract: Provided is a design support device capable of effectively utilizing defect knowledge in design work and reducing man-hours required for precise examination of a presented analysis result and variation depending on an individual user. A design support device that evaluates a defect that can occur in a design model generated by a design tool and a factor of the defect is configured to include a causal model database that stores a causal model expressing a defect that can occur in a design target by using a causal relationship in which, due to a certain phenomenon, another phenomenon occurs, an attribute information extraction unit that extracts attribute information regarding a design target from the design model, and a relevance degree evaluation unit that extracts, for the causal model, a causal relationship including a content matching with the extracted attribute information as a causal relationship having a high relevance degree to the design model.

公开(公告)号：US20230342382A1

公开(公告)日：2023-10-26

申请号：US18185506

申请日：2023-03-17

Applicant: HITACHI, LTD.

Inventor： Yuuki SHIMIZU

IPC: G06F16/332 ,  G06F40/40 ,  G06F16/31

CPC classification number: G06F16/3329 ,  G06F40/40 ,  G06F16/322

Abstract: A knowledge extracting device includes: a question input section which inputs a predetermined question; a question transmitting section which transmits the predetermined question and a new question generated by a question generating section to a respondent terminal; a response acquiring section which acquires a response to a question from the respondent terminal; a question generating section which generates a new question related to the response acquired by the response acquiring section; a relating section which generates, as structured knowledge, a tree structure in which a set of responses acquired by the response acquiring section is associated such that a previously obtained response is a superordinate element of the tree structure and a later obtained response is a subordinate element of the tree structure; and a knowledge output section which outputs the generated structured knowledge as a response to the predetermined question.

公开(公告)号：US20220374299A1

公开(公告)日：2022-11-24

申请号：US17764737

申请日：2020-08-31

Applicant: Hitachi, Ltd.

Inventor： Yuuki SHIMIZU

IPC: G06F11/07

Abstract: This failure tree generation device includes: a causal relationship storage unit that stores information indicating a linkage of the causal relationship of defects of respective component parts constituting subjects to be analyzed in a manner such that the information is associated with the connection relationship of the respective component parts; a system-level failure tree generation unit that generates, for each of the component parts and on the basis of component part constitution information indicating the constitution of component parts to be analyzed and component part connection information indicating the connection relationship of the respective component parts, first element information which is information indicating disturbance having occurred in information transfer between the respective component parts and which indicates the relationship between each of the component parts and a phenomenon having occurred on the component part, and generates, on the basis of the respective items of first element information, system level failure tree information indicating the causal relationship of defects of the component parts; and an equipment/component part level failure tree generation unit that searches for the causal relationship storage unit on the basis of the component part constitution information and the component part connection information, that generates two or more items of second element information indicating information relating to a plurality of events connecting to any one first element and indicating the relationship between the respective component parts and phenomena having occurred on the respective component parts, and that generates, on the basis of the respective items of the second element information, equipment/component part level failure tree information indicating the causal relationship of defects of the component parts, by way of a hierarchical structure.