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    Single Photon IR Detectors and Their Integration With Silicon Detectors
    1.
    发明申请
    Single Photon IR Detectors and Their Integration With Silicon Detectors 有权
    单光子红外探测器及其与硅探测器的集成

    公开(公告)号：US20130082286A1

    公开(公告)日：2013-04-04

    申请号：US12502225

    申请日：2009-07-13

    申请人： Hod Finkelstein ,  Sadik C. Esener ,  Yu-Hwa Lo ,  Kai Zhao ,  James Cheng ,  Sifang You

    发明人： Hod Finkelstein ,  Sadik C. Esener ,  Yu-Hwa Lo ,  Kai Zhao ,  James Cheng ,  Sifang You

    IPC分类号： H01L31/12

    CPC分类号： H01L31/055 ,  H01L31/0336 ,  Y02E10/52

    摘要： Apparatuses and systems for photon detection can include a first optical sensing structure structured to absorb light at a first optical wavelength; and a second optical sensing structure engaged with the first optical sensing structure to allow optical communication between the first and the second optical sensing structures. The second optical sensing structure can be structured to absorb light at a second optical wavelength longer than the first optical wavelength and to emit light at the first optical wavelength which is absorbed by the first optical sensing structure. Apparatuses and systems can include a bandgap grading region.

    摘要翻译： 用于光子检测的装置和系统可以包括被构造为吸收第一光波长的光的第一光学感测结构; 以及与第一光学感测结构接合以允许第一和第二光学感测结构之间的光学通信的第二光学感测结构。 第二光学感测结构可被构造为吸收长于第一光学波长的第二光学波长的光并且发射由第一光学感测结构吸收的第一光学波长的光。 设备和系统可以包括带隙分级区域。

    Single photon IR detectors and their integration with silicon detectors
    2.
    发明授权
    Single photon IR detectors and their integration with silicon detectors 有权
    单光子红外探测器及其与硅探测器的集成

    公开(公告)号：US08637875B2

    公开(公告)日：2014-01-28

    申请号：US12502225

    申请日：2009-07-13

    申请人： Hod Finkelstein ,  Sadik C. Esener ,  Yu-Hwa Lo ,  Kai Zhao ,  James Cheng ,  Sifang You

    发明人： Hod Finkelstein ,  Sadik C. Esener ,  Yu-Hwa Lo ,  Kai Zhao ,  James Cheng ,  Sifang You

    IPC分类号： H01L31/12

    CPC分类号： H01L31/055 ,  H01L31/0336 ,  Y02E10/52

    摘要： Apparatuses and systems for photon detection can include a first optical sensing structure structured to absorb light at a first optical wavelength; and a second optical sensing structure engaged with the first optical sensing structure to allow optical communication between the first and the second optical sensing structures. The second optical sensing structure can be structured to absorb light at a second optical wavelength longer than the first optical wavelength and to emit light at the first optical wavelength which is absorbed by the first optical sensing structure. Apparatuses and systems can include a bandgap grading region.

    摘要翻译： 用于光子检测的装置和系统可以包括被构造为吸收第一光波长的光的第一光学感测结构; 以及与第一光学感测结构接合以允许第一和第二光学感测结构之间的光学通信的第二光学感测结构。 第二光学感测结构可被构造为吸收长于第一光学波长的第二光学波长的光并且发射由第一光学感测结构吸收的第一光学波长的光。 设备和系统可以包括带隙分级区域。