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公开(公告)号:US20100232228A1
公开(公告)日:2010-09-16
申请号:US12715692
申请日:2010-03-02
申请人: Hong Soo JEON , Ji-Sang LEE , Oh Suk KWON
发明人: Hong Soo JEON , Ji-Sang LEE , Oh Suk KWON
CPC分类号: G11C16/3454
摘要: A method of programming a memory device includes comparing a first verify voltage and a distribution voltage of at least one memory cell, and if a result of the comparison is a pass, adjusting the distribution voltage until the distribution voltage is higher than a second verify voltage while comparing the distribution voltage and the second verify voltage.
摘要翻译: 一种对存储器件进行编程的方法包括比较第一验证电压和至少一个存储器单元的分配电压,并且如果比较结果是通过,则调整分配电压直到分配电压高于第二验证电压 同时比较分配电压和第二验证电压。