公开(公告)号：US10712870B2

公开(公告)日：2020-07-14

申请号：US15758602

申请日：2015-09-09

Applicant: Huawei Technologies Co., Ltd.

Inventor： Wenchao Xiao ,  Shaowu Hu ,  Gang Xu ,  Rui Zhang ,  Wushuang Jiang

IPC: G09G5/00 ,  G06F3/041 ,  G06F3/044

Abstract: A method for improving fault tolerance of a touchscreen determines an abnormal node, and shield the abnormal node to improve the fault tolerance of the touchscreen. The method includes detecting a capacitance value of each node in the touchscreen, comparing the detected capacitance value of each node with a preset capacitance value of each node to determine N target nodes, where N is an integer greater than or equal to zero, and the target nodes are nodes whose capacitance values vary, determining whether an abnormal node is included in the N target nodes, where the abnormal node is a target node determined when no touch operation occurs on the touchscreen, and discarding a row value, a column value, and a capacitance variation value of the abnormal node when the abnormal node is included in the N target nodes.

公开(公告)号：US20180275826A1

公开(公告)日：2018-09-27

申请号：US15758602

申请日：2015-09-09

Applicant: Huawei Technologies Co., Ltd.

Inventor： Wenchao Xiao ,  Shaowu Hu ,  Gang Xu ,  Rui Zhang ,  Wushuang Jiang

IPC: G06F3/041 ,  G06F3/044

Abstract: A method for improving fault tolerance of a touchscreen determines an abnormal node, and shield the abnormal node to improve the fault tolerance of the touchscreen. The method includes detecting a capacitance value of each node in the touchscreen, comparing the detected capacitance value of each node with a preset capacitance value of each node to determine N target nodes, where N is an integer greater than or equal to zero, and the target nodes are nodes whose capacitance values vary, determining whether an abnormal node is included in the N target nodes, where the abnormal node is a target node determined when no touch operation occurs on the touchscreen, and discarding a row value, a column value, and a capacitance variation value of the abnormal node when the abnormal node is included in the N target nodes.