Abstract:
A test system is provided for performing functional tests on combinatorial and sequential monolithic devices with the testing automatically programmed under control of a computer processing unit. The test results can be printed out on a printer, logged on tape and/or punched on cards. Tests are performed by the system under the control of an operational test program comprised of a plurality of interrelated subprograms. The operational test program is run by a computer processing unit which processes the programmed instructions through an input-output logic control section which sets up the test circuit configurations in and commands to an analog section. The analog section provides the required bias, pin resistor loads and signal levels to a device under test. The test parameter data is sensed by a digital voltmeter for conversion from analog-todigital data form, and for optional visual display if desired. The digital test parameter data is inserted in a comparator for pass/fail logic comparison. High, Low and/or No-Fail information is added by the comparator and sent with the converted digital information to the input-output logic control section where the data is serialized and fed to the computer processing unit for logging or analysis.
Abstract:
A test system is provided for performing functional tests on combinatorial and sequential monolithic devices with the testing automatically programmed under control of a computer processing unit. The test results can be printed out on a printer, logged on tape and/or punched on cards.