Apparatus and method for controlling the reliability stress rate on a processor
    1.
    发明授权
    Apparatus and method for controlling the reliability stress rate on a processor 有权
    用于控制处理器上的可靠性应力率的装置和方法

    公开(公告)号:US09317389B2

    公开(公告)日:2016-04-19

    申请号:US13931115

    申请日:2013-06-28

    CPC classification number: G06F11/3024 G06F11/004 G06F11/008 G06F11/3058

    Abstract: An apparatus and method for tracking stress on a processor and responsively controlling operating conditions. For example, one embodiment of a processor comprises: stress tracking logic to determine stress experienced by one or more portions of the processor based on current operating conditions of the one or more portions of the processor; and stress control logic to control one or more operating characteristics of the processor based on the determined stress and a target stress accumulation rate.

    Abstract translation: 用于跟踪处理器上的应力并响应于控制操作条件的装置和方法。 例如,处理器的一个实施例包括:应力跟踪逻辑,用于基于处理器的一个或多个部分的当前操作条件来确定处理器的一个或多个部分所经受的应力; 以及压力控制逻辑,以基于所确定的应力和目标应力累积速率来控制处理器的一个或多个操作特性。

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