公开(公告)号：US09417170B2

公开(公告)日：2016-08-16

申请号：US13550344

申请日：2012-07-16

Applicant: Igor Sokolov ,  Maxim Evgenevich Dokukin

Inventor： Igor Sokolov ,  Maxim Evgenevich Dokukin

IPC: G01L25/00 ,  G01N3/32

CPC classification number: G01N3/32 ,  G01N2203/0094 ,  G01N2203/0218

Abstract: The present invention provides an apparatus and method including hardware and software, which allows collecting and analyzing of data to obtain information about mechanical properties of soft materials. This allows surface mapping of viscoelastic properties in a high-resolution and fast manner. It also allows finding the degree of nonlinearity of the material response of the sample during the measurements. The apparatus can be used as a stand-alone device, or an add-on to either the existing atomic force microscope or nanoindenter device.

Abstract translation: 本发明提供了一种包括硬件和软件的装置和方法，其允许收集和分析数据以获得关于软材料的机械性质的信息。 这允许以高分辨率和快速方式的粘弹性质的表面映射。 它还允许在测量期间找到样品的材料响应的非线性度。 该装置可以用作独立装置，或者用于现有原子力显微镜或纳米压印装置的附加装置。

公开(公告)号：US20130018623A1

公开(公告)日：2013-01-17

申请号：US13550344

申请日：2012-07-16

Applicant: Igor Sokolov ,  Maxim Evgenevich Dokukin

Inventor： Igor Sokolov ,  Maxim Evgenevich Dokukin

IPC: G01M7/02 ,  G06F19/00

CPC classification number: G01N3/32 ,  G01N2203/0094 ,  G01N2203/0218

Abstract: The present invention provides an apparatus and method including hardware and software, which allows collecting and analyzing of data to obtain information about mechanical properties of soft materials. This allows surface mapping of viscoelastic properties in a high-resolution and fast manner. It also allows finding the degree of nonlinearity of the material response of the sample during the measurements. The apparatus can be used as a stand-alone device, or an add-on to either the existing atomic force microscope or nanoindenter device.

Abstract translation: 本发明提供了一种包括硬件和软件的装置和方法，其允许收集和分析数据以获得关于软材料的机械性质的信息。 这允许以高分辨率和快速方式的粘弹性质的表面映射。 它还允许在测量期间找到样品的材料响应的非线性度。 该装置可以用作独立装置，或者用于现有原子力显微镜或纳米压印装置的附加装置。