Inspection device and inspection method
    1.
    发明授权
    Inspection device and inspection method 有权
    检验装置及检验方法

    公开(公告)号:US09360436B2

    公开(公告)日:2016-06-07

    申请号:US14079568

    申请日:2013-11-13

    Abstract: The disclosure provides an inspection device including a light source module, an image receiving module and a processing unit. The light source module emits a first incident light and a second incident light to a device under test (DUT). The image receiving module receives a first image corresponding to the DUT irradiated by the first incident light, and receives a second image corresponding to the DUT irradiated by the second incident light. The processing unit calculates the contrast ratio of the first image and the second image to obtain a high-contrast image for inspection.

    Abstract translation: 本发明提供一种包括光源模块,图像接收模块和处理单元的检查装置。 光源模块向待测器件(DUT)发射第一入射光和第二入射光。 图像接收模块接收与由第一入射光照射的DUT对应的第一图像,并且接收与由第二入射光照射的DUT对应的第二图像。 处理单元计算第一图像和第二图像的对比度,以获得用于检查的高对比度图像。

    INSPECTION DEVICE AND INSPECTION METHOD
    2.
    发明申请
    INSPECTION DEVICE AND INSPECTION METHOD 有权
    检查装置和检查方法

    公开(公告)号:US20140168417A1

    公开(公告)日:2014-06-19

    申请号:US14079568

    申请日:2013-11-13

    Abstract: The disclosure provides an inspection device including a light source module, an image receiving module and a processing unit. The light source module emits a first incident light and a second incident light to a device under test (DUT). The image receiving module receives a first image corresponding to the DUT irradiated by the first incident light, and receives a second image corresponding to the DUT irradiated by the second incident light. The processing unit calculates the contrast ratio of the first image and the second image to obtain a high-contrast image for inspection.

    Abstract translation: 本发明提供一种包括光源模块,图像接收模块和处理单元的检查装置。 光源模块向待测器件(DUT)发射第一入射光和第二入射光。 图像接收模块接收与由第一入射光照射的DUT对应的第一图像,并且接收与由第二入射光照射的DUT对应的第二图像。 处理单元计算第一图像和第二图像的对比度,以获得用于检查的高对比度图像。

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