公开(公告)号：US20240210932A1

公开(公告)日：2024-06-27

申请号：US18064895

申请日：2022-12-12

Applicant: Industrial Technology Research Institute

Inventor： Meng-Lin LI ,  Yu-Hung PAI ,  Hung-Tsai WU ,  Chun-Chieh WANG

IPC: G05B23/02

CPC classification number: G05B23/024 ,  G05B23/0221

Abstract: A device state evaluation method based on current signals is applied to a target device that is powered on, the device state evaluation method includes: collecting a plurality of target current signals corresponding to the target device via an acquisition module; performing a signature extraction operation and a normalization operation via a computing module to obtain a target matrix by using the plurality of target current signals; and performing a diagnosis operation on the target matrix via a diagnosis module to identify whether the target device is in a malfunction state, where an identification result of the diagnosis operation is used as target information. Therefore, whether the target device is in the malfunction state can be evaluated by analyzing the plurality of target current signals. A device state evaluation system is also provided.