公开(公告)号：US12164056B2

公开(公告)日：2024-12-10

申请号：US17512984

申请日：2021-10-28

Applicant: Infineon Technologies AG

Inventor： Ajayan Vijayakumaran Nair ,  David Michael Addison ,  Markus Bichl ,  Moustafa Samy Abdelkhalek Ahmed Emara ,  Andre Roger ,  Dyson Wilkes

IPC: G01S7/35

Abstract: In some methods, sampled values based on a reception signal are stored in rows and columns of a memory array. A first 1-dimensional (1D) detector is moved in a first direction over the memory array. The first 1D detector includes a first cell under test and first and second training cells on opposite sides of the first cell under test. The first cell under test and the first and second training cells of the first 1D detector being aligned in the first direction. A second 1D detector is moved over the memory array. The second 1D detector includes a second cell under test and third and fourth training cells on opposite sides of the second cell under test. The second cell under test and the third and fourth training cells of the second 1D detector are aligned in a second direction that is perpendicular to the first direction.

公开(公告)号：US20230138972A1

公开(公告)日：2023-05-04

申请号：US17512984

申请日：2021-10-28

Applicant: Infineon Technologies AG

Inventor： Ajayan Vijayakumaran Nair ,  David Michael Addison ,  Markus Bichl ,  Moustafa Samy Abdelkhalek Ahmed Emara ,  Andre Roger ,  Dyson Wilkes

IPC: G01S7/35

Abstract: In some methods, sampled values based on a reception signal are stored in rows and columns of a memory array. A first 1-dimensional (1D) detector is moved in a first direction over the memory array. The first 1D detector includes a first cell under test and first and second training cells on opposite sides of the first cell under test. The first cell under test and the first and second training cells of the first 1D detector being aligned in the first direction. A second 1D detector is moved over the memory array. The second 1D detector includes a second cell under test and third and fourth training cells on opposite sides of the second cell under test. The second cell under test and the third and fourth training cells of the second 1D detector are aligned in a second direction that is perpendicular to the first direction.