公开(公告)号：US20150261657A1

公开(公告)日：2015-09-17

申请号：US14620597

申请日：2015-02-12

Applicant: Infosys Limited

Inventor： Rupa Sravani Kommineni ,  Anjaneyulu Pasala ,  Vaibhav Ahlawat ,  Luis Ignacio Moreno Aracena ,  Satya Prateek Bommaraju

IPC: G06F11/36

CPC classification number: G06F11/3676 ,  G06F11/3684

Abstract: The technique relates to methods and devices for generating minimized test suites using a genetic algorithm. The technology involves generating a plurality of test cases corresponding to a plurality of test paths associated with an activity diagram of a software requirement specification thereafter obtaining a plurality of test coverage criteria for test suite minimization and finally determining a subset of the plurality of test cases which satisfies the plurality of test coverage criteria by using a multi objective optimization technique. The technology also involves prioritizing the subset of the plurality of test cases based on node defect probability wherein the node defect probability is determined by using a bug prediction technique based on previous bug history of the node thereafter the priorities are dynamically re-ordered during test execution.

Abstract translation: 该技术涉及使用遗传算法生成最小化测试套件的方法和设备。 该技术涉及产生与多个测试路径相对应的多个测试用例，该多个测试路径与软件需求规范的活动图相关联，然后获得用于测试套件最小化的多个测试覆盖标准，并最终确定多个测试用例的子集， 通过使用多目标优化技术来满足多个测试覆盖率标准。 该技术还涉及基于节点缺陷概率对多个测试用例的子集进行优先级排序，其中通过使用基于先前故障历史的故障预测技术来确定节点缺陷概率，此后优先级在测试执行期间被动态重新排序 。