Apparatus and method for application testing of embedded system
    1.
    发明授权
    Apparatus and method for application testing of embedded system 有权
    嵌入式系统应用测试装置及方法

    公开(公告)号:US08549491B2

    公开(公告)日:2013-10-01

    申请号:US12620755

    申请日:2009-11-18

    IPC分类号: G06F9/44

    CPC分类号: G06F11/3664 G06F11/3688

    摘要: Provided is to an apparatus for application testing of an embedded system which can cross-develop an application program installed in the embedded system regardless of the type of a target system. A virtual environment for testing the application program adopted in the target system is constructed on the basis of information inputted through a user interface and the application program is tested by configuring a virtual target system in the constructed virtual environment. According to the present invention, the application program adopted in the target system can be developed and tested without constructing a cross-development environment for each target system in an environment in which various kinds of embedded systems are developed.

    摘要翻译: 提供了一种用于嵌入式系统的应用测试的装置,其可以交叉开发安装在嵌入式系统中的应用程序,而不管目标系统的类型如何。 基于通过用户界面输入的信息构建用于测试目标系统中采用的应用程序的虚拟环境,并且通过在构建的虚拟环境中配置虚拟目标系统来测试应用程序。 根据本发明,可以开发和测试目标系统中采用的应用程序,而不需要在开发各种嵌入式系统的环境中为每个目标系统构建交叉开发环境。