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公开(公告)号：US20210396575A1
公开(公告)日：2021-12-23
申请号：US17297810
申请日：2019-11-27
发明人： Reto HÄRING , Christian RIXNER , Florian SCHEWE , Siegbert SADOWSKI , Angel GAVRAILOV , Christian DOTZLER , Martin MANGSTL
摘要： The invention relates to a method for the sequential measurement of a plurality of semiconductor-based light sources such as LEDs, OLEDs or VCSELs, in particular comparatively low-luminosity light sources such as so-called micro-LEDs. The invention further relates to a device for carrying out the method. The object of the present invention is to provide a method that operates faster, more accurately and more sensitively than the known methods, which operate by scanning with a photodiode or with a spectrometer. The method according to the invention proposes for this that a current pulse is applied by means of a pulsed current source (1) to the low-luminosity light sources consecutively or simultaneously. The emitted light pulse of the LED (2) is converted into electric charge carriers by means of a photodiode (3), the electric charge carriers are added up by means of an integrator circuit (5), the added-together charge carriers are converted by means of an A/D converter (6) into a digital signal and the digital signal is forwarded to a measurement and control unit (7). The invention also relates to a method and a corresponding device for the sequential measurement of a plurality of optical pulses, wherein the pulsed light radiation enters an Ulbricht sphere (10) through an inlet opening (11), a first portion of the light radiation, which exits the Ulbricht sphere (10) following interaction with the same through a first outlet opening, is measured by means of a first detector (14, 18) and a second portion of the light radiation, which exits the Ulbricht sphere (10) without interaction with the same through a second outlet opening (19), is measured by means of a second detector (14′).
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公开(公告)号：US20210270670A1
公开(公告)日：2021-09-02
申请号：US17268932
申请日：2019-08-09
发明人： Mathias HOH , Reto HARING , Florian SCHEWE , Martin MANGSTL , Thorsten KOPP
摘要： The invention relates to a method for monitoring a spectroradiometer (4), in particular for measuring light-emitting test objects (1), in which the spectral data of the test objects (1) are captured by means of an optical system, wherein the radiometric, photometric and/or colorimetric quantities of the test objects (1) are ascertained from the spectral data. The problem addressed by the invention is that of specifying a method for monitoring a spectroradiometer (4), where it is not the continuous recalibration of the spectroradiometer (4) but the monitoring of when a calibration is necessary that is paramount. The invention solves this problem by virtue of changes in the wavelength scale, in the light throughput and/or in the spectral sensitivity of the spectroradiometer (4) being detected by way of a reference light source (5), integrated into the optical system, with a defined spectrum. Optionally, at least one detector integrated into the optical system can additionally monitor the stability of the reference light source (5). Moreover, the invention relates to a device for carrying out the method.
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