公开(公告)号：US20240412366A1

公开(公告)日：2024-12-12

申请号：US18812700

申请日：2024-08-22

Applicant: Intel Corporation

Inventor： Jiaxiang Jiang ,  Athmanarayanan Lakshmi Narayanan ,  Nilesh Ahuja ,  Ibrahima Jacques Ndiour ,  Ergin Utku Genc ,  Mahesh Subedar ,  Omesh Tickoo

IPC: G06T7/00

Abstract: Systems, apparatus, articles of manufacture, and methods to detect anomalies in three-dimensional (3D) images are disclosed. Example apparatus disclosed herein generate a first two-dimensional (2D) anomaly map corresponding to a first 2D image slice of a 3D image, the first 2D image slice corresponding to a first axis of the 3D image. Disclosed example apparatus also generate a second 2D anomaly map corresponding to a second 2D image slice of the 3D image, the second 2D image slice corresponding to a second axis of the 3D image. Disclosed example apparatus further generate a 3D anomaly volume based on the first 2D anomaly map and the second 2D anomaly detection, the 3D anomaly volume corresponding to the 3D image.