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公开(公告)号:US20240412366A1
公开(公告)日:2024-12-12
申请号:US18812700
申请日:2024-08-22
Applicant: Intel Corporation
Inventor: Jiaxiang Jiang , Athmanarayanan Lakshmi Narayanan , Nilesh Ahuja , Ibrahima Jacques Ndiour , Ergin Utku Genc , Mahesh Subedar , Omesh Tickoo
IPC: G06T7/00
Abstract: Systems, apparatus, articles of manufacture, and methods to detect anomalies in three-dimensional (3D) images are disclosed. Example apparatus disclosed herein generate a first two-dimensional (2D) anomaly map corresponding to a first 2D image slice of a 3D image, the first 2D image slice corresponding to a first axis of the 3D image. Disclosed example apparatus also generate a second 2D anomaly map corresponding to a second 2D image slice of the 3D image, the second 2D image slice corresponding to a second axis of the 3D image. Disclosed example apparatus further generate a 3D anomaly volume based on the first 2D anomaly map and the second 2D anomaly detection, the 3D anomaly volume corresponding to the 3D image.