Stacked die package with through-mold thermally conductive structures between a bottom die and a thermally conductive material

    公开(公告)号:US10541190B2

    公开(公告)日:2020-01-21

    申请号:US15769705

    申请日:2015-11-30

    Inventor: Chandra Jha Eric Li

    Abstract: An apparatus is described that includes a first semiconductor die. A second semiconductor die is stacked on the first semiconductor die. The first semiconductor die has a larger surface area than the second semiconductor die such that there exists a peripheral region of the first semiconductor die that is not covered by the second semiconductor die. The apparatus includes thermally conductive material above the second semiconductor die. The apparatus includes a compound mold between the thermally conductive material and both the second semiconductor die and the peripheral region of the first semiconductor die. The apparatus includes a thermally conductive structure extending through the compound mold that thermally couples the peripheral region to the thermally conductive material.

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