公开(公告)号：US10339026B2

公开(公告)日：2019-07-02

申请号：US15393909

申请日：2016-12-29

Applicant: Intel Corporation

Inventor： Indrajit Manna ,  Jakub Wenus ,  Mariano J. Phielipp ,  Suraj Sindia

IPC: G06F11/07 ,  G06F11/30 ,  G06N3/04

Abstract: Technologies for monitoring a characteristic of a monitored system include determining a measured value of the primary characteristic of the monitored system sensed by a primary sensor and a measured value of the secondary characteristic of the monitored system sensed by a secondary sensor, and predicating a predicted value of the primary characteristic based on the measured value of the secondary characteristic. The measured and predicted values of the primary characteristic are used to determine whether the primary sensor is properly functioning.

公开(公告)号：US20180189659A1

公开(公告)日：2018-07-05

申请号：US15393909

申请日：2016-12-29

Applicant: Intel Corporation

Inventor： Indrajit Manna ,  Jakub Wenus ,  Mariano J. Phielipp ,  Suraj Sindia

IPC: G06N5/04 ,  G06F11/30

CPC classification number: G06F11/3089 ,  G06F11/0709 ,  G06F11/0751 ,  G06N3/0445

Abstract: Technologies for monitoring a characteristic of a monitored system include determining a measured value of the primary characteristic of the monitored system sensed by a primary sensor and a measured value of the secondary characteristic of the monitored system sensed by a secondary sensor, and predicating a predicted value of the primary characteristic based on the measured value of the secondary characteristic. The measured and predicted values of the primary characteristic are used to determine whether the primary sensor is properly functioning.