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1.发明授权Method, apparatus, and system for measurement of noise statistics and bit error ratio estimation 有权用于测量噪声统计和误码率估计的方法，装置和系统公开(公告)号：US09374202B2
公开(公告)日：2016-06-21
申请号：US13842320
申请日：2013-03-15
Applicant: Intel Corporation
Inventor： Adee O. Ran , Amir Mezer , Ophir Gazinski , Sanjay R. Ravi , David G. Ellis , Stephen J. Peters , Jeffrey M. Shuey
CPC classification number: H04L1/203
Abstract: A sample voltage is received from a device at a first slicer element and a second slicer element. A decision by the first slicer element based on the sample voltage is identified and compared with a decision of the second slicer element based on the sample voltage. The decision of the second slicer element is to be generated from a comparison of the sample voltage with a reference voltage for the second slicer element. Comparing the decisions can be the basis of a soft error ratio determined for a device.
Abstract translation: 从第一限幅元件和第二限幅元件的装置接收采样电压。 基于样本电压确定第一限幅元件的判定，并根据采样电压与第二限幅元件的判定进行比较。 第二限幅元件的决定是从采样电压与第二限幅元件的参考电压的比较产生的。 比较决策可以是为设备确定的软错误率的基础。
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