公开(公告)号：US20190304989A1

公开(公告)日：2019-10-03

申请号：US15943548

申请日：2018-04-02

Applicant: Intel Corporation

Inventor： Yu-Lin CHAO ,  Sarvesh H. KULKARNI

IPC: H01L27/112 ,  H01L23/525 ,  H01L21/8238 ,  H01L27/11 ,  H01L29/78

Abstract: Embodiments herein may describe techniques for an integrated circuit including a MOSFET having a semiconductor well, a source area and a drain area next to the semiconductor well, a gate electrode, and a base terminal. The gate electrode may be coupled to the base terminal, hence forming a floating body MOSFET. A junction may exist between the drain area and the semiconductor well. A first resistance may exist between the source area and the drain area through the semiconductor well. A programming operation may be performed when the gate electrode is coupled to a high impedance, a programming voltage is applied at the source area, and the drain area is coupled to a ground voltage to break the junction between the drain area and the semiconductor well to generate a current between the source area, the semiconductor well, and the drain area. Other embodiments may be described and/or claimed.

公开(公告)号：US20190304907A1

公开(公告)日：2019-10-03

申请号：US15943541

申请日：2018-04-02

Applicant: Intel Corporation

Inventor： Yu-Lin CHAO ,  Sarvesh H. KULKARNI ,  Vincent E. DORGAN ,  Uddalak BHATTACHARYA

IPC: H01L23/525 ,  H01L27/02 ,  H01L27/112 ,  H01L29/78

Abstract: Embodiments herein may describe techniques for an integrated circuit including a MOSFET having a source area, a channel area, a gate electrode, and a drain area. The channel area may include a first channel region with a dopant of a first concentration next to the source area, and a second channel region with the dopant of a second concentration higher than the first concentration next to the drain area. A source electrode may be in contact with the source area, a gate oxide layer above the channel area, and the gate electrode above the gate oxide layer. A first resistance exists between the source electrode and the gate electrode. A second resistance exists between the source electrode, the gate electrode, and a path through the gate oxide layer to couple the source electrode and the gate electrode after a programming operation is performed. Other embodiments may be described and/or claimed.