公开(公告)号：US20030033566A1

公开(公告)日：2003-02-13

申请号：US09927011

申请日：2001-08-09

Applicant: International Business Machines Corporation

Inventor： Thomas W. Bartenstein ,  L. Owen Farnsworth III ,  Douglas C. Heaberlin ,  Edward E. Horton III ,  Leendert M. Huisman ,  Leah M. Pastel ,  Glen E. Richard ,  Raymond J. Rosner ,  Francis Woytowich

IPC: G11C029/00

CPC classification number: G11C29/26

Abstract: A method of testing a semiconductor device having a memory is disclosed. The method includes selecting a portion of the memory; testing the selected portion of the memory; designating the selected portion of the memory as a designated memory in response to an acceptable testing result; and storing data in the designated portion of the memory for retrieval at a later time. Provision for soft repair of the selected memory is made. Test data can be compressed before being stored in the designated memory.

Abstract translation: 公开了一种测试具有存储器的半导体器件的方法。 该方法包括选择存储器的一部分; 测试存储器的选定部分; 响应于可接受的测试结果，将存储器的所选部分指定为指定存储器; 并在稍后的时间将数据存储在存储器的指定部分中以进行检索。 对所选择的存储器进行软修复。 测试数据可以在存储在指定的存储器中之前进行压缩。