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公开(公告)号：US10760891B2
公开(公告)日：2020-09-01
申请号：US15936851
申请日：2018-03-27
发明人： Philipp Steuer
摘要： Surface measuring apparatus for measuring a surface of a workpiece has a probe including a probe arm bearing a probe element for contacting workpiece surface to be measured. Surface measuring apparatus also has a feed apparatus for moving probe element relative to workpiece to be measured. Probe arm is detachably connectable or connected to a movable part of feed apparatus via a mechanical interface having a first part and a second part, which in installed position of probe arm are connected to one another with static determinacy on movable part of feed apparatus, and one of the parts is associated with probe arm and the other part is associated with feed apparatus. At least one alignment protrusion is on first part as an installation alignment aid, which in installed position of probe arm contactlessly or essentially contactlessly engages in an alignment recess formed on second part.
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公开(公告)号：US20190101371A1
公开(公告)日：2019-04-04
申请号：US15936851
申请日：2018-03-27
发明人： Philipp Steuer
摘要： Surface measuring apparatus for measuring a surface of a workpiece has a probe including a probe arm bearing a probe element for contacting workpiece surface to be measured. Surface measuring apparatus also has a feed apparatus for moving probe element relative to workpiece to be measured. Probe arm is detachably connectable or connected to a movable part of feed apparatus via a mechanical interface having a first part and a second part, which in installed position of probe arm are connected to one another with static determinacy on movable part of feed apparatus, and one of the parts is associated with probe arm and the other part is associated with feed apparatus. At least one alignment protrusion is on first part as an installation alignment aid, which in installed position of probe arm contactlessly or essentially contactlessly engages in an alignment recess formed on second part.
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公开(公告)号：US10928177B2
公开(公告)日：2021-02-23
申请号：US16273501
申请日：2019-02-12
发明人： Philipp Steuer , Wolfgang Speck
IPC分类号： G01B5/016
摘要： Measuring apparatus for surface or contour measurement on a workpiece has a probe for contacting the surface of workpiece to be measured. Probe has a holding part to which a probe arm is detachably connectable or connected. Measuring apparatus also has a feed apparatus for moving probe relative to workpiece to be measured, and a control apparatus for controlling feed apparatus. A position sensor associated with probe arm and connected to control apparatus is provided, and which detects changes in the position of the probe arm, relative to holding part, from a measuring position into an interference position of probe arm, and generates a position change signal. Control apparatus is designed and programmed in such a way that, as a response to a position change signal, it generates a control signal for controlling feed apparatus in such a way that feed movement of probe is influenced.
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