MICROMETER-BASED MEASURING SYSTEM AND METHOD OF USING SAME
    2.
    发明申请
    MICROMETER-BASED MEASURING SYSTEM AND METHOD OF USING SAME 审中-公开
    基于微机的测量系统及其使用方法

    公开(公告)号:US20080184583A1

    公开(公告)日:2008-08-07

    申请号:US11767022

    申请日:2007-06-22

    IPC分类号: G01B3/18 G01B5/02

    CPC分类号: G01B3/18 G01B5/02 G01B5/063

    摘要: A measuring system (100) includes a measuring instrument (10) and a processing device (20). The measuring instrument includes a base (12), a guide column (14), a sliding member (16), and a digital micrometer (18). The guide column is vertically attached to the base. The sliding member is moveably attached to the guide column. The digital micrometer is firmly fastened to the sliding member. The processing device is electronically connected with the digital micrometer. The processing device receives a measured value from the digital micrometer and diplays a testing result after processing the measured value.

    摘要翻译: 测量系统(100)包括测量仪器(10)和处理设备(20)。 测量仪器包括基座(12),导柱(14),滑动构件(16)和数字测微器(18)。 引导柱垂直连接到基座。 滑动构件可移动地附接到导向柱。 数字测微计牢固地固定在滑动构件上。 处理装置与数字千分尺电子连接。 处理装置从数字千分尺接收测量值,并在处理测量值后显示测试结果。