SEMICONDUCTOR APPARATUS AND DISPLAY APPARATUS

    公开(公告)号:US20170277586A1

    公开(公告)日:2017-09-28

    申请号:US15464602

    申请日:2017-03-21

    Abstract: According to an aspect, a semiconductor apparatus includes semiconductor devices. Each semiconductor device includes: a state monitor that monitors a plurality of functions implemented by the semiconductor device, and outputs state monitoring signals; and an anomaly determination circuit that performs anomaly determination based on the state monitoring signals. When the anomaly determination circuit of a first semiconductor device detects that one or more of the functions of the semiconductor devices are abnormal based on a first anomaly determination result and a second anomaly determination result, the anomaly determination circuit of the first semiconductor device outputs an anomaly detection signal to the semiconductor devices. The first anomaly determination result is a result of the anomaly determination performed on the functions of the first semiconductor device, and the second anomaly determination result is a result of the anomaly determination performed on the functions of a second semiconductor device.

    Display device, display method, and electronic device
    2.
    发明授权
    Display device, display method, and electronic device 有权
    显示设备,显示方式和电子设备

    公开(公告)号:US09495922B2

    公开(公告)日:2016-11-15

    申请号:US13772495

    申请日:2013-02-21

    Abstract: Disclosed herein is a display device including: a display section configured to have a plurality of scanning signal lines to which respective scanning signals are applied, the display section performing line-sequential scanning by repeating interruption and resumption of the line-sequential scanning on a basis of the plurality of scanning signals, and displaying an image; and a scanning section configured to generate the plurality of scanning signals such that transition times on a pulse termination side of the respective scanning signals are equal to each other.

    Abstract translation: 本文公开了一种显示装置,包括:显示部,被配置为具有施加有相应扫描信号的多条扫描信号线,所述显示部通过重复中断进行行顺序扫描,并基于该顺序扫描恢复 的多个扫描信号,并显示图像; 以及扫描部,被配置为产生多个扫描信号,使得各个扫描信号的脉冲终端侧的转变时间彼此相等。

    DISPLAY DEVICE, DISPLAY METHOD, AND ELECTRONIC DEVICE
    5.
    发明申请
    DISPLAY DEVICE, DISPLAY METHOD, AND ELECTRONIC DEVICE 审中-公开
    显示装置,显示方法和电子装置

    公开(公告)号:US20170025083A1

    公开(公告)日:2017-01-26

    申请号:US15285507

    申请日:2016-10-05

    Abstract: Disclosed herein is a display device including: a display section configured to have a plurality of scanning signal lines to which respective scanning signals are applied, the display section performing line-sequential scanning by repeating interruption and resumption of the line-sequential scanning on a basis of the plurality of scanning signals, and displaying an image; and a scanning section configured to generate the plurality of scanning signals such that transition times on a pulse termination side of the respective scanning signals are equal to each other.

    Abstract translation: 本文公开了一种显示装置,包括:显示部,被配置为具有施加有相应扫描信号的多条扫描信号线,所述显示部通过重复中断进行行顺序扫描,并基于该顺序扫描恢复 的多个扫描信号,并显示图像; 以及扫描部,被配置为产生多个扫描信号,使得各个扫描信号的脉冲终端侧的转变时间彼此相等。

    Semiconductor apparatus and display apparatus

    公开(公告)号:US10599507B2

    公开(公告)日:2020-03-24

    申请号:US15464602

    申请日:2017-03-21

    Abstract: According to an aspect, a semiconductor apparatus includes semiconductor devices. Each semiconductor device includes: a state monitor that monitors a plurality of functions implemented by the semiconductor device, and outputs state monitoring signals; and an anomaly determination circuit that performs anomaly determination based on the state monitoring signals. When the anomaly determination circuit of a first semiconductor device detects that one or more of the functions of the semiconductor devices are abnormal based on a first anomaly determination result and a second anomaly determination result, the anomaly determination circuit of the first semiconductor device outputs an anomaly detection signal to the semiconductor devices. The first anomaly determination result is a result of the anomaly determination performed on the functions of the first semiconductor device, and the second anomaly determination result is a result of the anomaly determination performed on the functions of a second semiconductor device.

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