Method for making a flat magnetic structure for read/write magnetic heads
    2.
    发明授权
    Method for making a flat magnetic structure for read/write magnetic heads 失效
    制造用于读/写磁头的平面磁结构的方法

    公开(公告)号:US4821403A

    公开(公告)日:1989-04-18

    申请号:US113481

    申请日:1987-10-28

    摘要: A method of making a flat magnetic structure having coils thereon, said structure including magnetic read/write heads using a flat substrate that has at least one side made of a magnetic material, said method including the steps of:initial machining of the magnetic side of the substrate to form supporting means for conducting wires, which forms said coils, and to demarcate future magnetic poles of said magnetic read/write heads; then depositing, on either side or both sides of the substrate, connecting pins at a rate of two pins per said coil; then positioning the conducting wires on said supporting means to form the coils; then connecting the ends of the conducting wires of each coil to the corresponding connecting pins; then coating the machined magnetic side with an insulating material; and then machining and polishing the coated side until the magnetic poles are exposed.

    摘要翻译: 一种制造具有线圈的平坦磁性结构的方法,所述结构包括使用具有由磁性材料制成的至少一个侧面的平坦基板的磁性读/写头,所述方法包括以下步骤:初始加工 所述基板形成用于导线的支撑装置,其形成所述线圈,并且限定所述磁读/写头的未来磁极; 然后在每个线圈上以两个引脚的速率沉积在衬底的任一侧或两侧上的连接销; 然后将导线定位在所述支撑装置上以形成线圈; 然后将每个线圈的导线的端部连接到相应的连接销; 然后用绝缘材料涂覆加工的磁性面; 然后对涂层进行加工和抛光,直到磁极露出。

    Method for detection of end of grinding of a thin layer magnetic head
    3.
    发明授权
    Method for detection of end of grinding of a thin layer magnetic head 失效
    检测薄层磁头研磨结束的方法

    公开(公告)号:US5013394A

    公开(公告)日:1991-05-07

    申请号:US381749

    申请日:1989-06-26

    IPC分类号: G11B5/187 G11B5/23 G11B5/31

    摘要: The invention concerns a method for the detection of the end of grinding of at least one thin layer magnetic head, the head comprising, at the stage of implementation of said method, an active face, formed by two magnetic poles (1, 2) separated by a gap (4). The method comprises the following steps:deposition of a conductive layer (7) on the entire active face (3)etching of the active face coated with said conductive layer;deposition of a layer of dielectric material (8) on the etched active face;grinding of the active face starting from the face that is free of the layer of dielectric material (8) until total removal of that part of the conductive layer (7) located above the gap (4), this removal being detected by the sudden variation in resistivity between the two magnetic poles (1, 2).

    摘要翻译: PCT No.PCT / FR88 / 00518 Sec。 371日期:1989年6月26日 102(e)日期1989年6月26日PCT提交1988年10月21日PCT公布。 公开号WO89 / 04038 日期:1989年5月5日本发明涉及一种用于检测至少一个薄层磁头的研磨结束的方法,所述头部在所述方法的实施阶段包括由两个磁极形成的主动面 (1,2)由间隙(4)分开。 该方法包括以下步骤:在整个有源面(3)上沉积涂覆有导电层的活性面的蚀刻; 介电材料层(8)沉积在蚀刻的有效面上; 从没有电介质材料层(8)的表面开始研磨活性表面,直到完全去除位于间隙(4)上方的导电层(7)的那部分,这种去除是由突变引起的 在两个磁极(1,2)之间的电阻率。