Abstract:
An HDP-CVD apparatus includes a valve assembly, a pump, and a control unit for adjusting the supply of He gas to be within a preset range through control of the valve assembly and the pump so that an actual wafer temperature, which was previously determined, is maintained at a preset temperature during a deposition process.
Abstract:
A display apparatus and a method of repairing a display apparatus are disclosed. According to one aspect, the display includes a plurality of unit pixels each including a plurality of sub pixels, scan lines branching off a scan wire in a first direction for each of the plurality of unit pixels and connecting the plurality of sub pixels emitting the same color as that of a neighboring unit pixel, data lines extending in a second direction orthogonal to the first direction and connected to the plurality of sub pixels, a first power supply line extending in the second direction and connected to the plurality of sub pixels, and second power supply lines extending in the first direction and connected to the first power supply line.
Abstract:
A method for forming a plurality of metal lines in a semiconductor device including forming first insulating layer patterns on a semiconductor substrate, the first insulating patterns being spaced from each other; depositing a metal layer on and between the first insulating layer patterns; planarizing the metal layer; patterning the planarized metal layer to form the plurality of metal lines between the first insulating layer patterns; and forming a second insulating layer on and between the metal lines.
Abstract:
A method fabricating multiple wiring metals in a semiconductor device. The method includes forming a lower wiring metal on a semiconductor substrate, forming an interlayer dielectric on the lower wiring metal, and selectively removing the interlayer dielectric to form a contact dielectric film, a body dielectric film and an opening between the contact and body dielectric films. The method also includes filling the opening with low-k material, forming a capping dielectric on the contact and body dielectric films and the low-k material, forming a contact hole passing through the capping dielectric and the contact dielectric film to be connected to the lower wiring metal, and forming an upper wiring metal electrically interconnected to the lower wiring metal through the contact hole.
Abstract:
A method fabricating multiple wiring metals in a semiconductor device. The method includes forming a lower wiring metal on a semiconductor substrate, forming an interlayer dielectric on the lower wiring metal, and selectively removing the interlayer dielectric to form a contact dielectric film, a body dielectric film and an opening between the contact and body dielectric films. The method also includes filling the opening with low-k material, forming a capping dielectric on the contact and body dielectric films and the low-k material, forming a contact hole passing through the capping dielectric and the contact dielectric film to be connected to the lower wiring metal, and forming an upper wiring metal electrically interconnected to the lower wiring metal through the contact hole.