Patent search ap:("KA IMAGING INC.") AND inv:"Christopher C. SCOTT" Page 1

1.

发明申请
METHOD AND SYSTEM FOR HIGH-RESOLUTION X-RAY DETECTION FOR PHASE CONTRAST X-RAY IMAGING 有权

公开(公告)号：US20210231588A1

公开(公告)日：2021-07-29

申请号：US17144679

申请日：2021-01-08

Applicant: KA IMAGING INC.

Inventor： Karim S. KARIM , Christopher C. SCOTT

IPC: G01N23/041 , A61B6/00

Abstract: A phase contrast X-ray imaging system for imaging an object including an X-ray source; and an X-ray detector having a 25 micron or less pixel pitch; wherein a distance between the X-ray source and the object is less than or equal to 10 cm. The X-ray detector further includes at least one single direct conversion layer to acquire at least one phase contrast edge-enhancement image.

2.

发明申请
METHOD AND SYSTEM FOR HIGH-RESOLUTION X-RAY DETECTION FOR PHASE CONTRAST X-RAY IMAGING 审中-公开

公开(公告)号：US20190113466A1

公开(公告)日：2019-04-18

申请号：US16050354

申请日：2018-07-31

Applicant: KA IMAGING INC.

Inventor： Karim S. KARIM , Christopher C. SCOTT

IPC: G01N23/041 , A61B6/00

Abstract: A phase contrast X-ray imaging system for imaging an object including an X-ray source; and an X-ray detector having a 25 micron or less pixel pitch; wherein a distance between the X-ray source and the object is less than or equal to 10 cm.

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