公开(公告)号：US20230137232A1

公开(公告)日：2023-05-04

申请号：US18048656

申请日：2022-10-21

Applicant: KABUSHIKI KAISHA YASKAWA DENKI

Inventor： Masahiro GOYA ,  Kohei TOYODA

IPC: G01M99/00 ,  B23K37/04

Abstract: A system for estimating an abnormality includes an industrial device that controls one or more jigs such that the one or more jigs press an object to perform a work process, and processing circuitry that acquires operation data that is related to an operation of the industrial device and is measured at multiple time points after the object is pressed by the one or more jigs, and perform an estimation estimating an abnormality based on the operation data acquired.

公开(公告)号：US20240091936A1

公开(公告)日：2024-03-21

申请号：US18527390

申请日：2023-12-04

Applicant: KABUSHIKI KAISHA YASKAWA DENKI

Inventor： Wataru WATANABE ,  Makoto TAKAHASHI ,  Masahiro GOYA ,  Tomoaki UCHIDA ,  Satoshi HIRONAKA

IPC: B25J9/16 ,  B25J9/00

CPC classification number: B25J9/1661 ,  B25J9/0084

Abstract: A robot automation system includes circuitry configured to generate a plurality of task patterns that are candidates of a task flow for performing a job including a plurality of tasks by at least one robot. Each of the plurality of task patterns includes a corresponding relationship between the plurality of tasks and the at least one robot. The circuitry is further configured to calculate an estimated cycle time of the job based on a simulation in which the at least one robot performs the plurality of tasks, for each of the plurality of task patterns. The circuitry is further configured to generate, as an operation program, at least one task flow for performing the job by the at least one robot, in response to comparing a preset reference cycle time for the job with the estimated cycle time for each of the plurality of task patterns.