公开(公告)号：US20230134186A1

公开(公告)日：2023-05-04

申请号：US18088766

申请日：2022-12-26

Applicant: Kabushiki Kaisha Yaskawa Denki

Inventor： Ryohei SUZUKI ,  Tsuyoshi Yokoya ,  Ryo Masumura ,  Hiroki Tachikake

IPC: G06N3/094

Abstract: Provided a machine learning data generation device including: at least one processor; and at least one memory device that stores a plurality of instructions which, when executed by the at least one processor, causes the at least one processor to execute: acquiring , in association with a predetermined label actual time series information; executing physical simulation of generating a plurality of pieces of virtual time series information; identifying parameter values based on the plurality of pieces of virtual time series information and the actual time series information, and to associate the identified parameter values with the label; generating a new parameter value and the label based on the identified parameter values; generating virtual time series information corresponding to a new internal state by executing physical simulation through use of the new parameter value; and generating new machine learning data.

公开(公告)号：US12111643B2

公开(公告)日：2024-10-08

申请号：US17408487

申请日：2021-08-23

Applicant: KABUSHIKI KAISHA YASKAWA DENKI

Inventor： Ryo Masumura ,  Masaru Adachi

IPC: G05B19/418 ,  G06N20/00

CPC classification number: G05B19/41875 ,  G06N20/00 ,  G05B2219/32368

Abstract: An inspection system includes machine learning circuitry configured to determine whether each of objects belongs to a predetermined attribute based on feature data of each of the objects, feature data acquisition circuitry configured to acquire feature data of reevaluated objects which are determined to belong to the predetermined attribute without using the machine learning circuitry among excluded objects which are determined not to belong to the predetermined attribute by the machine learning circuitry, and parameter update circuitry configured to update a learning parameter of the machine learning circuitry based on teaching data including the acquired feature data acquired by the feature data acquisition circuitry.