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公开(公告)号：US20230140482A1
公开(公告)日：2023-05-04
申请号：US18050226
申请日：2022-10-27
Applicant: KABUSHIKI KAISHA YASKAWA DENKI
Inventor： Ayaka HASHIMOTO , Tadashi OKUBO , Takashi KITAZAWA , Tsuyoshi YOKOYA
IPC: G05B19/418
Abstract: An abnormality information estimation system includes processing circuitry that identifies, based on operation data related to an operation of an industrial device that controls a mechanism, multiple unit phenomena due to the operation, and estimates abnormality information about an abnormality occurring in the mechanism based on the multiple of unit phenomena.
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