公开(公告)号：US20130241591A1

公开(公告)日：2013-09-19

申请号：US13887467

申请日：2013-05-06

Applicant: KEMET ELECTRONICS CORPORATION

Inventor： Jonathan Paulsen ,  Erik Karlsen Reed ,  Yuri Freeman

IPC: G01R31/12 ,  G01R31/14

CPC classification number: G01R31/1227 ,  G01R31/016 ,  G01R31/028 ,  G01R31/14 ,  H01G9/00 ,  H01G13/00

Abstract: A method for screening electrolytic capacitors places a capacitor in series with a resistor, applying a test voltage and following the charge curve for the capacitor. A high voltage drop across the capacitor indicates high reliability and a low voltage drop is used to reject the piece. The leakage current is not adversely affected during the test.

Abstract translation: 用于筛选电解电容器的方法将电容器与电阻器串联放置，施加测试电压并跟随电容器的充电曲线。 电容器两端的高电压降表示高可靠性，并且使用低压降来拒绝该片。 在测试期间漏电流不会受到不利影响。