公开(公告)号：US20210036384A1

公开(公告)日：2021-02-04

申请号：US16643298

申请日：2018-09-10

Applicant: KONICA MINOLTA, INC.

Inventor： Masahiro IMADA ,  Takuji HATANO ,  Koujirou SEKINE ,  Masaaki TSUCHIDA ,  Tsukasa YAGI

IPC: H01M10/42 ,  G01N3/40 ,  G01N23/041 ,  G01N25/72 ,  G01N27/83 ,  H01M10/0525

Abstract: A non-destructive inspection method of inspecting an inspection target using multiple different types of non-destructive inspection means that include one non-destructive inspection means and at least one other non-destructive inspection means. The method includes determining a marking position on the inspection target in a detection result by the one non-destructive inspection means, causing a device to store the marking position, and fixedly forming a mark on the inspection target corresponding to the marking position. The mark is detectable by the other non-destructive inspection means. The method further includes causing the other non-destructive inspection means to inspect an inspection target including the mark. The method further includes contrasting detection results by the multiple different types of non-destructive inspection means in reference to the mark which is the marking position.

公开(公告)号：US20200229782A1

公开(公告)日：2020-07-23

申请号：US16647107

申请日：2018-09-07

Applicant: Konica Minolta, Inc.

Inventor： Masahiro IMADA ,  Takuji HATANO ,  Koujirou SEKINE ,  Masaaki TSUCHIDA ,  Tsukasa YAGI

IPC: A61B6/00 ,  G01N23/083 ,  G01N23/223 ,  G03B42/02

Abstract: A non-destructive inspection method for inspecting an object to be inspected using a plurality of different types of non-destructive inspection means is shown. The method includes the following, fixedly forming common marks that can be detected by any of the plurality of non-destructive inspection means on the object to be inspected; then detecting the object to be inspected including the marks by the plurality of non-destructive inspection means respectively; and comparing the detection results by the plurality of non-destructive inspection means using the marks as positional references.