公开(公告)号：US12226245B2

公开(公告)日：2025-02-18

申请号：US18017143

申请日：2021-07-16

Applicant: KONINKLIJKE PHILIPS N.V.

Inventor： Klaus Alfred Erhard ,  Heiner Daerr ,  Artur Sossin ,  Axel Thran ,  Bernhard Johannes Brendel ,  Christian Haase ,  Claas Bontus

IPC: A61B6/12 ,  A61B6/00

Abstract: A spectral X-ray imaging system (100) includes an X-ray source (110) and an X-ray detector (120) that are mounted to a support structure (150). The support structure (150) is configured to rotate the X-ray source (110) and the X-ray detector (120) around two or more orthogonal axes (A-A′, B-B′). One or more processors (130) are configured to cause the system (100) to perform operations that include: generating a spectral image based on the spectral image data; and identifying, in the spectral image, a position of a first fiducial marker (180i) comprising a first material, based on a first X-ray absorption k-edge energy value (190i) of the first material.