公开(公告)号：US11116470B2

公开(公告)日：2021-09-14

申请号：US16606418

申请日：2018-04-17

Applicant: KONINKLIJKE PHILIPS N.V.

Inventor： Andriy Yaroshenko ,  Hanns-Ingo Maack ,  Thomas Koehler ,  Fabio De Marco ,  Lukas Benedict Gromann ,  Willer Konstantin ,  Peter Noel

IPC: A61B6/00 ,  G01T7/00

Abstract: The invention relates to beam hardening correction in X-ray Dark-Field imaging of a subject including a first material and a second material, the first and second material having different beam hardening properties. As the X-ray imaging data includes information on the internal structure of the imaged subject, such information may be used, together with appropriate calibration data to identify the beam hardening contributions occurring in the imaged area of the subject, so to allow for a correction of artifacts due to beam hardening in X-ray Dark-Field imaging.