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1.发明申请公开(公告)号：US20180180650A1
公开(公告)日：2018-06-28
申请号：US15702539
申请日：2017-09-12
Applicant: Korea Electronics Technology Institute
Inventor： Won Ki PARK , Dae Sung LEE , Dong Sun KIM
CPC classification number: G01R15/205 , G01R15/202 , G01R33/0029 , G01R33/07
Abstract: A measurement method and apparatus for correcting a disturbance and an offset of a sensor simultaneously are described. The method includes applying a bias current to first and second sensors of a Wheatstone bridge type connected with each other as a differential structure, and measuring a voltage of the first sensor and a voltage of the second sensor. The method also includes applying a bias current to the first and second sensors in a direction opposite to the direction in the first applying, and measuring a voltage of the first sensor and a voltage of the second sensor. The method further includes calculating a final measurement value based on the measured voltages. Accordingly, the offset and the influence of the disturbance of the sensor can be simultaneously removed through one circuit, such that advantageous effects such as reduced complexity, reduced area/volume, and shortened correction time can be achieved.
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公开(公告)号：US20230176011A1
公开(公告)日：2023-06-08
申请号：US17709567
申请日：2022-03-31
Applicant: KOREA ELECTRONICS TECHNOLOGY INSTITUTE
Inventor： Dae Sung LEE , Kwang Bum PARK
IPC: G01N27/66
CPC classification number: G01N27/66
Abstract: Disclosed is a photoionization gas sensor including an ultraviolet generating module having a first substrate, a second substrate, and a third substrate sequentially coupled in a vertical direction, and configured to generate ultraviolet by applying an electric field to a noble gas filling a first cavity, the first cavity formed in a central portion of the second substrate, and a measuring module configured to collect an electrical signal, the electrical signal being generated such that an electric field is applied to a passage, through which gas ionized by ultraviolet passes, so as to allow the ionized gas to come into contact with an electrode, thereby having a small volume and being operated at a low voltage.
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公开(公告)号：US20180180700A1
公开(公告)日：2018-06-28
申请号：US15702578
申请日：2017-09-12
Applicant: Korea Electronics Technology Institute
Inventor： Won Ki PARK , Dae Sung LEE
CPC classification number: G01R35/005 , G01R17/105 , G01R33/07
Abstract: A method and an apparatus for calculating an offset of a Wheatstone bridge type sensor are described. The offset calculation method includes measuring resistances between nodes of a Wheatstone bridge type sensor, calculating an offset of the sensor using the measured resistances and providing information on the calculated offset. Accordingly, the offset of the Wheatstone bridge type sensor can be rapidly and easily calculated independently from the size of a bias current, and ultimately. Furthermore, time required to measure can be reduced and thus a sensor fabrication cost can be reduced, and also, mass production can be enhanced.
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