公开(公告)号：US20200249173A1

公开(公告)日：2020-08-06

申请号：US16745359

申请日：2020-01-17

Applicant: KOREA INSTITUTE OF SCIENCE AND TECHNOLOGY

Inventor： Kang Bong LEE ,  Yun Sik NAM ,  Yeon Hee LEE ,  Sujin YOON

IPC: G01N21/78

Abstract: The present disclosure relates to a colorimetric sensor for detecting nickel ions using nanoprism etching, a method for producing the same, and a colorimetric detection method of nickel ions using the same. More specifically, the present disclosure relates to a colorimetric sensor for detecting nickel ions, which uses non-modified silver nanoprisms (AgNPRs), whose surfaces have not been modified, so that the nanoprisms are etched selectively only by nickel ions (Ni2+), leading to a color change and thus allowing to detect nickel ions (Ni2+), a method for producing the same, and a colorimetric detection method of nickel ions using the same.