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公开(公告)号:US12293573B2
公开(公告)日:2025-05-06
申请号:US17991908
申请日:2022-11-22
Inventor: Seung Ki Ryu , Yeo Hwan Yoon , Young Seok Kim
IPC: G06V10/774
Abstract: The present invention relates to an apparatus and method for generating learning data for an artificial intelligence model, which generate learning data for learning of an artificial intelligence model that detects anomalies of a plant facility, and the apparatus and method collect at least one among structured data and unstructured data, and generate a learning data set for learning of an artificial intelligence model that predicts and diagnoses anomalies of a plant facility using at least one among the structured data and the unstructured data.