公开(公告)号：US20220148179A1

公开(公告)日：2022-05-12

申请号：US17429298

申请日：2020-02-14

Applicant: KOWA COMPANY, LTD.

Inventor： Nobuhiko TAKEUCHI

IPC: G06T7/00 ,  G06T7/90 ,  G06T7/11 ,  A61B3/00

Abstract: A method for inspecting an ophthalmic device which allows reflected light from an imaging inspection subject, which has been irradiated with light by using an illumination optical system of the ophthalmic device, to be received by using an image-capturing optical system of the ophthalmic device to capture an image of the imaging inspection subject; extracts color information from the captured image of the imaging inspection subject; and determines whether or not the color information satisfies a prescribed reference condition by comparing the extracted color information with reference information. An inspection jig for an ophthalmic device is used in the method for inspecting an ophthalmic device. Furthermore, the ophthalmic device includes the inspection jig.