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公开(公告)号：US10392690B1
公开(公告)日：2019-08-27
申请号：US16274383
申请日：2019-02-13
摘要： A method for synthesizing thin film stainless steel coating can include using an e-beam PVD technique for depositing elements of stainless steel, i.e., Fe, Cr, Ni, Mo, and Mn, on a target surface, e.g., a surface of metallic origin. The method can include thermal evaporation of a source stainless steel material at a given percentage of electron beam power and a given vacuum pressure to provide a stainless steel coating layer on the target surface. The stainless steel coating layer can have a uniform thickness of about 150 nm, for example. The method can provide uniform stainless steel elemental distribution on the target surface. The stainless steel of the coating layer on the target surface can be of a grade that is different from the source stainless steel.
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公开(公告)号：US10476431B1
公开(公告)日：2019-11-12
申请号：US16529717
申请日：2019-08-01
摘要： The device and method for measuring the effect of soiling on a photovoltaic device includes a device in which a photovoltaic device (reference solar cell, solar cells, PV module, etc.) may be shifted between partially and fully enclosed compartments in quick succession for measurements of the same device (1) when directly exposed to illumination or solar radiation; (2) when placed under a glass or transparent cover maintained cleared or cleaned of soil; and (3) when placed under glass or transparent cover left exposed to natural outdoor soiling, or attenuated using simulated soil that is not periodically cleaned. The measurements may be of short circuit current (Isc), maximum power (Pmax), or other electrical parameter conventionally used to evaluate performance of the photovoltaic device. A soiling ratio calculated as: SR Pmax = 1 - P max 2 - P max 3 P max 1 or calculated as: SR Isc = 1 - I sc 2 - I sc 3 I sc 1 may be used to compare or monitor performance of the photovoltaic device between measurement cycles.
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公开(公告)号：US10447201B1
公开(公告)日：2019-10-15
申请号：US16244041
申请日：2019-01-09
IPC分类号： H02S50/10
摘要： The device and method for measuring the effect of soiling on a photovoltaic device includes a device in which a photovoltaic device (reference solar cell, solar cells, PV module, etc.) may be shifted between partially and fully enclosed compartments in quick succession for measurements of the same device (1) when directly exposed to illumination or solar radiation; (2) when placed under a glass or transparent cover maintained cleared or cleaned of soil; and (3) when placed under glass or transparent cover left exposed to natural outdoor soiling, or attenuated using simulated soil that is not periodically cleaned. The measurements may be of short circuit current (Isc), maximum power (Pmax), or other electrical parameter conventionally used to evaluate performance of the photovoltaic device. A soiling ratio calculated as: SR Pmax = 1 - P max 2 - P max 3 P max 1 or calculated as: SR Isc = 1 - I sc 2 - I sc 3 I sc 1 may be used to compare or monitor performance of the photovoltaic device between measurement cycles.
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公开(公告)号：US10594258B1
公开(公告)日：2020-03-17
申请号：US16528587
申请日：2019-07-31
摘要： The device and method for measuring the effect of soiling on a photovoltaic device includes a device in which a photovoltaic device (reference solar cell, solar cells, PV module, etc.) may be shifted between partially and fully enclosed compartments in quick succession for measurements of the same device (1) when directly exposed to illumination or solar radiation; (2) when placed under a glass or transparent cover maintained cleared or cleaned of soil; and (3) when placed under glass or transparent cover left exposed to natural outdoor soiling, or attenuated using simulated soil that is not periodically cleaned. The measurements may be of short circuit current (Isc), maximum power (Pmax), or other electrical parameter conventionally used to evaluate performance of the photovoltaic device. A soiling ratio calculated as: SR Pmax = 1 - P max 2 - P max 3 P max 1 or calculated as: SR Isc = 1 - I sc 2 - I sc 3 I sc 1 may be used to compare or monitor performance of the photovoltaic device between measurement cycles.
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