公开(公告)号：US11940464B2

公开(公告)日：2024-03-26

申请号：US17431850

申请日：2020-02-14

Applicant: Kaiser Optical Systems Inc.

Inventor： Carsten Uerpmann ,  Michael Gordon Stidham

IPC: G01R1/067 ,  G01N21/65

CPC classification number: G01R1/06755 ,  G01N21/65

Abstract: One aspect of the present disclosure discloses a probe, including a probe body having a center axis defining a proximal end and a distal end and including an aperture in the distal end; a window affixed in the aperture, wherein the window is substantially optically transparent; and a flange adjoining the proximal end of the probe body, the flange including a sealing surface and a sealing edge, wherein the flange separates an in-process portion of the probe from an ex-process portion of the probe, the in-process portion including at least the probe body, the sealing surface and the sealing edge, where at least the in-process portion of the probe consists essentially of an austenitic stainless steel material. Further aspects include a computer product configured to execute a method employing the probe.

公开(公告)号：US20230194568A1

公开(公告)日：2023-06-22

申请号：US17431850

申请日：2020-02-14

Applicant: Kaiser Optical Systems Inc.

Inventor： Carsten Uerpmann ,  Michael Gordon Stidham

IPC: G01R1/067 ,  G01N21/65

CPC classification number: G01R1/06755 ,  G01N21/65

Abstract: One aspect of the present disclosure discloses a probe, including a probe body having a center axis defining a proximal end and a distal end and including an aperture in the distal end; a window affixed in the aperture, wherein the window is substantially optically transparent; and a flange adjoining the proximal end of the probe body, the flange including a sealing surface and a sealing edge, wherein the flange separates an in-process portion of the probe from an ex-process portion of the probe, the in-process portion including at least the probe body, the sealing surface and the sealing edge, where at least the in-process portion of the probe consists essentially of an austenitic stainless steel material. Further aspects include a computer product configured to execute a method employing the probe.