NONVOLATILE SEMICONDUCTOR STORAGE DEVICE AND MANUFACTURING METHOD

    公开(公告)号:US20240099027A1

    公开(公告)日:2024-03-21

    申请号:US18179895

    申请日:2023-03-07

    CPC classification number: H10B63/845 H10B63/10 H10B63/34

    Abstract: According to one embodiment, a cell block includes memory cells and select transistors. The memory cells correspond are connected in parallel between a local source line and a local bit line. The select transistor is connected between the local bit line and a bit line. The memory cell includes a cell transistor and a resistance change element. A gate of the cell transistor is connected to a word line. The resistance change element is connected to the cell transistor in series between the local source line and the local bit line. Each cell block is configured as a columnar structure penetrating a plurality of conductive films functioning as word lines. The select transistor and the local bit line are connected at a contact portion formed of a material different from a material of the local bit line.

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