公开(公告)号：US20200088650A1

公开(公告)日：2020-03-19

申请号：US16616011

申请日：2018-04-06

Applicant: Konica Minolta, Inc.

Inventor： Koji HARADA ,  Masato KASHIHARA ,  Taizo WAKIMURA

IPC: G01N21/88 ,  G01B11/30 ,  G06T7/00

Abstract: According to a surface defect inspection device and a surface defect inspection method according to the present invention, an inspection face of an inspection object is irradiated with illumination light, and a defect at the inspection face is detected, based on an image including the inspection face captured. According to the surface defect inspection device and the surface defect inspection method, the illumination light is emitted with formation of at least one set of a light region and a dark region, and a range of a defect detection image region for the detection of the defect, to be set to the image capturing the inspection face irradiated with the illumination light in the light region, is adjusted in accordance with a previously defined degree of visibility for orange peel, at the detection of the defect at the inspection face.