公开(公告)号：US12051146B2

公开(公告)日：2024-07-30

申请号：US17848735

申请日：2022-06-24

Applicant: Korea Advanced Institute of Science and Technology

Inventor： Sung-Eui Yoon ,  In Young Cho ,  Yuchi Huo

IPC: G06F15/00 ,  G06N3/08 ,  G06T5/70 ,  G06T15/06

CPC classification number: G06T15/06 ,  G06N3/08 ,  G06T5/70 ,  G06T2207/20081 ,  G06T2207/20084

Abstract: Disclosed is a ray clustering learning method based on weakly-supervised learning for denoising using ray tracing. The ray clustering learning method is for learning a denoising model for removing noise from a rendered image through ray tracing, and includes extracting a feature of a simulated ray through the ray tracing and clustering the ray through contrastive learning for the feature.