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公开(公告)号：US20230077298A1
公开(公告)日：2023-03-09
申请号：US17837392
申请日：2022-06-10
Inventor： Seungwoo LEE , Gwang Mok KIM , Jong Hwan OH
IPC: G01N21/65
Abstract: The present disclosure relates to a Raman analysis apparatus capable of real-time Raman analysis while performing an experiment under elevated temperature and pressure conditions in surface or material property analysis of a powder solid sample, a single-crystal sample, a high-concentration liquid sample, or the like, and a unit cell for Raman analysis adapted to the Raman analysis apparatus.
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