公开(公告)号：US20020153920A1

公开(公告)日：2002-10-24

申请号：US09977377

申请日：2001-10-16

Applicant: LG.PHILIPS LCD CO., LTD

Inventor： Man-Hoan Lee

IPC: G01R031/00

CPC classification number: G09G3/006 ,  G02F1/1309 ,  G02F2001/133397 ,  G09G3/3648 ,  G09G2320/0257

Abstract: A method for measuring an image sticking defect in a liquid crystal display device includes the steps of grounding a liquid crystal cell, the liquid crystal cell includes an alignment layer, applying a first alternating current voltage to the liquid crystal cell, measuring a first capacitance of the liquid crystal cell, applying an electrical stress to the liquid crystal cell, measuring a second capacitance of the liquid crystal cell, and calculating a capacitance difference between the first capacitance and the second capacitance.

Abstract translation: 一种用于测量液晶显示装置中的图像残留缺陷的方法包括以下步骤：使液晶单元接地，液晶单元包括取向层，向液晶单元施加第一交流电压，测量第一电容 液晶单元，向液晶单元施加电应力，测量液晶单元的第二电容，以及计算第一电容和第二电容之间的电容差。