公开(公告)号：US20040239364A1

公开(公告)日：2004-12-02

申请号：US10847288

申请日：2004-05-18

Applicant: LG.Philips LCD Co., Ltd.

Inventor： Han Rok Chung

IPC: G01R031/00

CPC classification number: G02F1/136259 ,  G02F2001/136254

Abstract: An apparatus of inspecting a liquid crystal display device includes a magnetic sensor scanning a signal line pattern on a substrate to detect a defective position of the signal line pattern, a camera imaging the signal line pattern detected by the magnetic sensor, an inspecting jig contacting a probe pin with the signal line pattern to determine the existence of defective in the signal line pattern, a transferring tool system transferring at least one of the substrate, the magnetic sensor and the camera in a two-axis direction, and a controller controlling the magnetic sensor, the camera, the inspecting jig and the transferring tool system.

Abstract translation: 检查液晶显示装置的装置包括：磁传感器，扫描基板上的信号线图案，以检测信号线图案的不良位置，对由磁传感器检测的信号线图案进行成像的相机;与 具有信号线图案的探针，以确定信号线图案中是否存在缺陷，传送工具系统沿两轴方向传送基板，磁传感器和相机中的至少一个，以及控制磁性的控制器 传感器，相机，检查夹具和传送工具系统。