公开(公告)号：US20020067325A1

公开(公告)日：2002-06-06

申请号：US09978055

申请日：2001-10-17

Applicant: LG.Philips LCD Co., Ltd.

Inventor： Hyoung Rack Choi

IPC: G09G003/36

CPC classification number: G09G3/3648 ,  G09G2320/0257 ,  G09G2360/145

Abstract: A method for measuring an image-sticking defect in a liquid crystal display device includes steps of irradiating light from a backlight to the liquid crystal display device, displaying a first full white state on a liquid crystal display screen of the liquid crystal display device to which the light is irradiated, measuring first luminance values of a plurality of designated points on the liquid crystal display screen, calculating an average luminance value of the first full white state using the first luminance values, displaying a full black state on the liquid crystal display screen, measuring second luminance values of the plurality of designated points on the liquid crystal display screen, calculating an average luminance value of the full black state using the second luminance values, forming a gray scale using the average luminance value of the first full white states and the average luminance value of the full black state, displaying a second full white state on the liquid crystal display screen, and measuring a luminance change of the second full white state with time at the plurality of designated points using the gray scale.

Abstract translation: 一种用于测量液晶显示装置中的图像粘附缺陷的方法包括以下步骤：将来自背光源的光照射到液晶显示装置，在液晶显示装置的液晶显示屏上显示第一全白态， 照射光，测量液晶显示屏上的多个指定点的第一亮度值，使用第一亮度值计算第一全白状态的平均亮度值，在液晶显示屏上显示全黑状态 测量液晶显示屏上的多个指定点的第二亮度值，使用第二亮度值计算全黑状态的平均亮度值，使用第一全白状态的平均亮度值形成灰度;以及 全黑状态的平均亮度值，在液体哭泣上显示第二满白色状态 并且使用灰度在多个指定点处测量第二全白状态随时间的亮度变化。