公开(公告)号：US20230370172A1

公开(公告)日：2023-11-16

申请号：US17746230

申请日：2022-05-17

Applicant: LitePoint Corporation

Inventor： Chen CAO ,  Christian Volf OLGAARD ,  Ruizu WANG ,  Qingjie LU

IPC: H04B17/00

CPC classification number: H04B17/0085

Abstract: An example process determines a first error vector magnitude (EVM) of a signal output by a device under test (DUT). The process includes adding attenuation on a signal path between the DUT and a vector signal analyzer (VSA), where the attenuation is changeable: measuring, at the VSA, at least two second EVMs for different values of attenuation of the signal output by the DUT, where the at least two second EVMs are corrupted by noise from the VSA, and where each of the at least two second EVMs is based on two or more measurements; and determining the first EVM based on a linear relationship that is based on the first EVM, the at least two second EVMs, and a function based on the attenuation, where the first EVM is without at least some of the noise from the VSA.