SINGLE POINT OFFSET CALIBRATION FOR INERTIAL SENSORS
    1.
    发明申请
    SINGLE POINT OFFSET CALIBRATION FOR INERTIAL SENSORS 有权
    用于惯性传感器的单点偏移校准

    公开(公告)号:US20140012531A1

    公开(公告)日:2014-01-09

    申请号:US13936117

    申请日:2013-07-05

    申请人: MCube, Inc.

    IPC分类号: G01P21/00

    CPC分类号: G01P21/00 G01C25/005

    摘要: A hand-held processor system for processing data from an integrated MEMS (Micro-Electro-Mechanical-Systems) device disposed within a hand-held computer system and methods therefor. The Single Point Offset Correction (SPOC) process computes offset values to calibrate MEMS sensors using a single set of data measurements at an orientation without dynamic perturbation, and without requiring advance knowledge of orientation of the device. Arbitrary output biases, which are known to be dominant on a single axis, can be corrected to ensure consistent performance. The SPOC process provides a simple method to effectively calibrate a MEMS sensor without requiring extensive system resources. This process can be enhanced by additional estimations of sensor offsets using the set of data measurements or by use of rule-based empirical gain factors.

    摘要翻译: 一种用于处理设置在手持计算机系统内的集成MEMS(微机电系统)装置的数据的手持处理器系统及其方法。 单点偏移校正(SPOC)过程计算偏移值,以在没有动态扰动的方向上使用单个数据测量集来校准MEMS传感器,并且不需要事先了解设备的取向。 已知在单个轴上占优势的任意输出偏差可以被校正,以确保一致的性能。 SPOC过程提供了一种简单的方法来有效地校准MEMS传感器,而不需要大量的系统资源。 可以通过使用该组数据测量或通过使用基于规则的经验增益因子的传感器偏移的附加估计来增强该过程。